But going vertical comes at a cost, which has left chipmakers scrambling to find ways to reduce wafer-edge defects. Those defects significantly impede the ability to yield all die on the wafer, and ...
Researchers from Australian National University and Chinese PV module manufacturer Longi investigated the wafer quality of n-type industrial ingots made via the Recharged Czochralski (RCz) process ...
Larger wafer sizes often mean more defects and potentially higher costs, driving the need for inspection equipment to find defects early and help prevent low-yield wafers. If Semi's forecast is ...